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Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations.

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DETAILS

  • Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space
  • Dissertationsschrift
  • Niknahad, Mahtab
  • Kartoniert, IX, 160 S.
  • graph. Darst.
  • Sprache: Englisch
  • 24 cm
  • ISBN-13: 978-3-7315-0038-4
  • Titelnr.: 41556971
  • Gewicht: 401 g
  • KIT Scientific Publishing (2013)
  • Herstelleradresse

    KIT Scientific Publishing

    Strasse am Forum 2

    76131 - DE Karlsruhe

    E-Mail: info@ksp.kit.edu

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