
- Yuan, J. S.
- Juin Jei Liou
Semiconductor Device Physics and Simulation
- Gebunden,
- Springer, Berlin
- (1998)
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The advent of the microelectronics technology has made ever-increasing numbers of small devices on a same chip. The rapid emergence of ultra-large-scaled-integrated (ULSI) technology has moved device dimension into the sub-quarter-micron regime and put more than 10 million transistors on a single chip. While traditional closed-form analytical models furnish useful intuition into how semiconductor devices behave, they no longer provide consistently accurate results for all modes of operation of ...
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MicrodevicesDETAILS
- Semiconductor Device Physics and Simulation
- Yuan, J. S., Juin Jei Liou
- Gebunden, xii, 336 S.
- XII, 336 p.
- Sprache: Englisch
- 254 mm
- ISBN-13: 978-0-306-45724-1
- Titelnr.: 23301430
- Gewicht: 885 g
- Springer, Berlin (1998)
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