
- Spaeth, Johann-Martin
- Overhof, H.
Point Defects in Semiconductors and Insulators
- Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions
- Herausgegeben:Queisser, Hans-Joachim
- Gebunden,
- Springer, Berlin
- (2003)
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The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap peared about 10 years ago. Since then a very active development has oc curred both with respect to the experimental methods and the theoretical interpretation of the experimental results. It would therefore not have been sufficient to simply publish a second edition of the precedent book with cor rections and a few additions. Furthermore the applicat ...
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DETAILS
- Point Defects in Semiconductors and Insulators
- Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions
- Spaeth, Johann-Martin, Overhof, H.
- Gebunden, xi, 492 S.
- XI, 492 p.
- Sprache: Englisch
- 235 mm
- ISBN-13: 978-3-540-42695-0
- Titelnr.: 11577053
- Gewicht: 860 g
- Springer, Berlin (2003)
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69121 - DE Heidelberg
E-Mail: buchhandel-buch@springer.com
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