Produktbild
Kühnert, ChristianData-driven Methods for Fault Localization in Process TechnologyDissertationsschrift
Kartoniert, KIT Scientific Publishing (2013)
45,00 €
inkl. MwSt.
versandkostenfrei

Control systems at production plants consist of a large number of process variables. When detecting abnormal behavior, these variables generate an alarm. Due to the interconnection of the plant\'s devices the fault can lead to an alarm flood. This again hides the original location of the causing device. In this work several data-driven approaches for root cause localization are proposed, compared and combined. All methods analyze disturbed process data for backtracking the propagation path.

DETAILS

Data-driven Methods for Fault Localization in Process Technology

Dissertationsschrift

Kühnert, Christian

Kartoniert, XVIII, 224 S.

graph. Darst.

Sprache: Englisch

21 cm

KIT Scientific Publishing (2013)

Gewicht: 370 g

ISBN-13: 978-3-7315-0098-8

Titelnr.: 43039692

Bewertungen (0)
Jetzt bewerten
Mehr von Christian Kühnert
Gesamtsumme

inkl. MwSt.

Sie haben bisher keine Artikel in deinen Warenkorb gelegt. Bitte verwenden Sie hierfür den Button 'kaufen'.